Eun-Joo Lee

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for quantitative detection of multiple electromigration fail...
- Patent number 7,818,655
- Issue date Oct 19, 2010
- Advanced Micro Devices, Inc.
- Eun-Joo Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optimizing an optical proximity correction...
- Patent number 7,788,609
- Issue date Aug 31, 2010
- GLOBALFOUNDRIES Inc.
- Hung-Eil Kim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR OPTIMIZING AN OPTICAL PROXIMITY CORRECTION...
- Publication number 20090249261
- Publication date Oct 1, 2009
- HUNG-EIL KIM
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY