EUNHEE JEANG

Person

PAJU-SI, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer processing apparatus
- Patent number 11,996,270
- Issue date May 28, 2024
- Samsung Electronics Co., Ltd.
- Eunhee Jeang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of fabricating a semiconductor device
- Patent number 11,955,387
- Issue date Apr 9, 2024
- Samsung Electronics Co., Ltd.
- Seongkeun Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polarization measuring device and method of fabricating semiconduct...
- Patent number 11,946,809
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Ingi Kim
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection system and method of manufacturing semiconduct...
- Patent number 11,823,961
- Issue date Nov 21, 2023
- Samsung Electronics Co., Ltd.
- Eunhee Jeang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming plasma processing apparatus, related apparatus, a...
- Patent number 11,715,628
- Issue date Aug 1, 2023
- Samsung Electronics Co., Ltd.
- Jeongil Mun
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF FABRICATING A SEMICONDUCTOR DEVICE
- Publication number 20240162096
- Publication date May 16, 2024
- Samsung Electronics Co., Ltd.
- Seongkeun CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...
- Publication number 20240145315
- Publication date May 2, 2024
- Samsung Electronics Co., Ltd.
- EUNHEE JEANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ILLUMINATION CORRECTION APPARATUS
- Publication number 20240069443
- Publication date Feb 29, 2024
- Samsung Electronics Co., Ltd.
- Donghyeong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EUV COLLECTOR INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230108698
- Publication date Apr 6, 2023
- Samsung Electronics Co., Ltd.
- Jongbin Park
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
POLARIZATION MEASURING DEVICE AND METHOD OF FABRICATING SEMICONDUCT...
- Publication number 20230068376
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Ingi KIM
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROCESSING APPARATUS
- Publication number 20220216039
- Publication date Jul 7, 2022
- Samsung Electronics Co., Ltd.
- Eunhee Jeang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING A SEMICONDUCTOR DEVICE
- Publication number 20220199473
- Publication date Jun 23, 2022
- Samsung Electronics Co., Ltd.
- Seongkeun CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING PLASMA PROCESSING APPARATUS, RELATED APPARATUS, A...
- Publication number 20220044912
- Publication date Feb 10, 2022
- Samsung Electronics Co., Ltd.
- Jeongil MUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...
- Publication number 20210305106
- Publication date Sep 30, 2021
- Samsung Electronics Co., Ltd.
- EUNHEE JEANG
- H01 - BASIC ELECTRIC ELEMENTS

EUNHEE JEANG

Person

Patents Grantslast 30 patents

Wafer processing apparatus

Method of fabricating a semiconductor device

Polarization measuring device and method of fabricating semiconduct...

Substrate inspection system and method of manufacturing semiconduct...

Method of forming plasma processing apparatus, related apparatus, a...

Patents Applicationslast 30 patents

METHOD OF FABRICATING A SEMICONDUCTOR DEVICE

SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...

ILLUMINATION CORRECTION APPARATUS

EUV COLLECTOR INSPECTION APPARATUS AND INSPECTION METHOD

POLARIZATION MEASURING DEVICE AND METHOD OF FABRICATING SEMICONDUCT...

WAFER PROCESSING APPARATUS

METHOD OF FABRICATING A SEMICONDUCTOR DEVICE

METHOD OF FORMING PLASMA PROCESSING APPARATUS, RELATED APPARATUS, A...

SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...