Eunhye OH

Person

Yongin-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Operating and testing semiconductor devices
- Patent number 12,334,170
- Issue date Jun 17, 2025
- Samsung Electronics Co., Ltd.
- Taewook Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storage device including mapping memory and method of operating the...
- Patent number 12,164,376
- Issue date Dec 10, 2024
- Samsung Electronics Co., Ltd.
- Eunhye Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self-test circuits and semiconductor integrated circuits i...
- Patent number 11,867,757
- Issue date Jan 9, 2024
- Samsung Electronics Co., Ltd.
- Heejune Lee
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Built-in-self-test logic, memory device with same, and memory modul...
- Patent number 11,804,276
- Issue date Oct 31, 2023
- Samsung Electronics Co., Ltd.
- Eunhye Oh
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit and method of testing the same
- Patent number 11,698,410
- Issue date Jul 11, 2023
- Samsung Electronics Co., Ltd.
- Eunhye Oh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method for writing data in a memory
- Patent number 11,698,852
- Issue date Jul 11, 2023
- Samsung Electronics Co., Ltd.
- Jaeshin Lee
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE INCLUDING BUILT-IN-SELF-TES...
- Publication number 20250191671
- Publication date Jun 12, 2025
- Samsung Electronics Co., Ltd.
- Jaehyeok KIM
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE INCLUDING MAPPING MEMORY AND METHOD OF OPERATING THE...
- Publication number 20250068517
- Publication date Feb 27, 2025
- Samsung Electronics Co., Ltd.
- Eunhye OH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE WITH SAME, AND MEMORY MODUL...
- Publication number 20240021261
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- EUNHYE OH
- G11 - INFORMATION STORAGE
Information Patent Application
OPERATING AND TESTING SEMICONDUCTOR DEVICES
- Publication number 20240006008
- Publication date Jan 4, 2024
- Samsung Electronics Co., Ltd.
- Taewook PARK
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE INCLUDING MAPPING MEMORY AND METHOD OF OPERATING THE...
- Publication number 20230214297
- Publication date Jul 6, 2023
- Samsung Electronics Co., Ltd.
- Eunhye OH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE WITH SAME, AND MEMORY MODUL...
- Publication number 20220293205
- Publication date Sep 15, 2022
- Samsung Electronics Co., Ltd.
- EUNHYE OH
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF TESTING THE SAME
- Publication number 20220206062
- Publication date Jun 30, 2022
- Samsung Electronics Co., Ltd.
- Eunhye Oh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BUILT-IN SELF-TEST CIRCUITS AND SEMICONDUCTOR INTEGRATED CIRCUITS I...
- Publication number 20220187366
- Publication date Jun 16, 2022
- Samsung Electronics Co., Ltd.
- Heejune Lee
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR WRITING DATA IN A MEMORY
- Publication number 20210165733
- Publication date Jun 3, 2021
- Samsung Electronics Co., Ltd.
- Jaeshin LEE
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Operating and testing semiconductor devices

Storage device including mapping memory and method of operating the...

Built-in self-test circuits and semiconductor integrated circuits i...

Built-in-self-test logic, memory device with same, and memory modul...

Semiconductor integrated circuit and method of testing the same

Apparatus and method for writing data in a memory

Patents Applicationslast 30 patents

BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE INCLUDING BUILT-IN-SELF-TES...

STORAGE DEVICE INCLUDING MAPPING MEMORY AND METHOD OF OPERATING THE...

BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE WITH SAME, AND MEMORY MODUL...

OPERATING AND TESTING SEMICONDUCTOR DEVICES

STORAGE DEVICE INCLUDING MAPPING MEMORY AND METHOD OF OPERATING THE...

BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE WITH SAME, AND MEMORY MODUL...

SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF TESTING THE SAME

BUILT-IN SELF-TEST CIRCUITS AND SEMICONDUCTOR INTEGRATED CIRCUITS I...

APPARATUS AND METHOD FOR WRITING DATA IN A MEMORY