Eunsoo Hwang

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting a wafer and apparatus for performing the same
- Patent number 12,111,270
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Juntaek Oh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MODULE, SPECTROSCOPIC DEVICE FOR HYPERSPECTRAL IMAGING, AND...
- Publication number 20250076116
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Sunhong Jun
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240125709
- Publication date Apr 18, 2024
- Samsung Electronics Co., Ltd.
- Donggun Lee
- G01 - MEASURING TESTING
Information Patent Application
IMAGING ELLIPSOMETER AND METHOD OF MEASURING AN OVERLAY ERROR USING...
- Publication number 20230408401
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Jaehyeon Son
- G01 - MEASURING TESTING
Information Patent Application
IMAGING ASSEMBLY AND SPECTRAL IMAGING ELLIPSOMETER INCLUDING THE SAME
- Publication number 20230204422
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Jinwoo Ahn
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME
- Publication number 20230104399
- Publication date Apr 6, 2023
- Samsung Electronics Co., Ltd.
- Juntaek Oh
- G01 - MEASURING TESTING