Eva L. Benitez

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for optically inspecting a sample for anomalies
- Patent number 7,012,683
- Issue date Mar 14, 2006
- KLA-Tencor Technologies Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for optically inspecting a sample for anomalies
- Patent number 6,833,913
- Issue date Dec 21, 2004
- KLA-Tencor Technologies Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and methods for optically inspecting a sample for anomalies
- Publication number 20050092899
- Publication date May 5, 2005
- KLA-Tencor Technologies Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING