Eva Sevick-Muraca

Person

  • Lafayette, IN, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Particle analysis system and method

    • Patent number 7,187,441
    • Issue date Mar 6, 2007
    • The Texas A&M University System
    • Eva Sevick-Muraca
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Fluorescence imaging system and method

    • Patent number 5,865,754
    • Issue date Feb 2, 1999
    • Purdue Research Foundation Office of Technology Transfer
    • Eva M. Sevick-Muraca
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Particle analysis system and method

    • Patent number 5,818,583
    • Issue date Oct 6, 1998
    • Purdue Research Foundation
    • Eva Sevick-Muraca
    • G01 - MEASURING TESTING