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Eva Sevick-Muraca
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Lafayette, IN, US
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Patents Grants
last 30 patents
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Patent Grant
Particle analysis system and method
Patent number
7,187,441
Issue date
Mar 6, 2007
The Texas A&M University System
Eva Sevick-Muraca
G01 - MEASURING TESTING
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Patent Grant
Fluorescence imaging system and method
Patent number
5,865,754
Issue date
Feb 2, 1999
Purdue Research Foundation Office of Technology Transfer
Eva M. Sevick-Muraca
G01 - MEASURING TESTING
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Patent Grant
Particle analysis system and method
Patent number
5,818,583
Issue date
Oct 6, 1998
Purdue Research Foundation
Eva Sevick-Muraca
G01 - MEASURING TESTING