Eval Shekel

Follow

Person

Jerusalem, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Spatial and spectral wavefront analysis and measurement
- Patent number 7,542,144
- Issue date Jun 2, 2009
- ICOS Vision Systems NV
- Yoel Arieli
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Spatial and spectral wavefront analysis and measurement
- Publication number 20080088851
- Publication date Apr 17, 2008
- NANO-OR TECHNOLOGIES INC.
- Yoel Arieli
- G01 - MEASURING TESTING