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Evan A. Dickinson
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Portland, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Test and measurement instrument and method of switching waveform di...
Patent number
9,529,017
Issue date
Dec 27, 2016
Tektronix, Inc.
Gregory A. Martin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test and measurement instrument and method of switching waveform di...
Patent number
8,818,744
Issue date
Aug 26, 2014
Tektronix, Inc.
Gregory A. Martin
G01 - MEASURING TESTING
Information
Patent Grant
Region overlap control for autorange/autoset functions
Patent number
8,482,564
Issue date
Jul 9, 2013
Tektronix, Inc.
Craig H. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Simple integrated control for zoom/pan functions
Patent number
7,847,792
Issue date
Dec 7, 2010
Tektronix, Inc.
Scott R. Ketterer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEST AND MEASUREMENT INSTRUMENT AND METHOD OF SWITCHING WAVEFORM DI...
Publication number
20140160144
Publication date
Jun 12, 2014
Tektronix, Inc.
Gregory A. Martin
G01 - MEASURING TESTING
Information
Patent Application
Test and Measurement Instrument and Method of Switching Waveform Di...
Publication number
20100100346
Publication date
Apr 22, 2010
Tektronix, Inc.
Gregory A. MARTIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
REGION OVERLAP CONTROL FOR AUTORANGE/AUTOSET FUNCTIONS
Publication number
20090109226
Publication date
Apr 30, 2009
Tektronix, Inc.
Craig H. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Indicia for Channels Collected Into a Group
Publication number
20080191894
Publication date
Aug 14, 2008
Tektronix, Inc.
Evan A. Dickinson
G01 - MEASURING TESTING
Information
Patent Application
Enhanced user interface for an oscilloscope
Publication number
20070285407
Publication date
Dec 13, 2007
Evan A. Dickinson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Simple integrated control for zoom/pan functions
Publication number
20070035658
Publication date
Feb 15, 2007
Scott R. Ketterer
G01 - MEASURING TESTING