Evan E. Davidson

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Hopewell Junction, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
On-chip temperature sensing system
- Patent number 5,639,163
- Issue date Jun 17, 1997
- International Business Machines Corporation
- Evan Ezra Davidson
- G01 - MEASURING TESTING
Information Patent Grant
Noise reduction during testing of integrated circuit chips
- Patent number 4,644,265
- Issue date Feb 17, 1987
- International Business Machines Corporation
- Evan E. Davidson
- G01 - MEASURING TESTING
Information Patent Grant
On-chip Delta-I noise clamping circuit
- Patent number 4,398,106
- Issue date Aug 9, 1983
- International Business Machines Corporation
- Evan E. Davidson
- G05 - CONTROLLING REGULATING