Evan Haynes

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McKinney, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Derotation assembly and method for a scanning sensor
- Patent number 9,442,003
- Issue date Sep 13, 2016
- Raytheon Company
- Evan Haynes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Derotation Assembly and Method for a Scanning Sensor
- Publication number 20150362363
- Publication date Dec 17, 2015
- Raytheon Company
- Evan Haynes
- G01 - MEASURING TESTING