Membership
Tour
Register
Log in
Evan M. Fledell
Follow
Person
Beaverton, OR, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Converged test platforms and processes for class and system testing...
Patent number
10,677,845
Issue date
Jun 9, 2020
Intel Corporation
Abram M. Detofsky
G01 - MEASURING TESTING
Information
Patent Grant
Interposer to regulate current for wafer test tooling
Patent number
9,391,447
Issue date
Jul 12, 2016
Intel Corporation
Evan M. Fledell
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Mechanism for facilitating a dynamic electro-mechanical interconnec...
Patent number
9,128,121
Issue date
Sep 8, 2015
Intel Corporation
Evan M. Fledell
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Patents Applications
last 30 patents
Information
Patent Application
CONVERGED TEST PLATFORMS AND PROCESSES FOR CLASS AND SYSTEM TESTING...
Publication number
20180252772
Publication date
Sep 6, 2018
Intel Corporation
Abram M. Detofsky
G01 - MEASURING TESTING
Information
Patent Application
Device, system and method for providing zone-based configuration of...
Publication number
20170187133
Publication date
Jun 29, 2017
Intel Corporation
Anne M. SEPIC
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MECHANISM FOR FACILITATING A DYNAMIC ELECTRO-MECHANICAL INTERCONNEC...
Publication number
20140091824
Publication date
Apr 3, 2014
Evan M. Fledell
G01 - MEASURING TESTING
Information
Patent Application
INTERPOSER TO REGULATE CURRENT FOR WAFER TEST TOOLING
Publication number
20140029150
Publication date
Jan 30, 2014
Evan M. Fledell
G01 - MEASURING TESTING