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Evan R. Williams
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Palo Alto, CA, US
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last 30 patents
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Patent Grant
Method and apparatus for continuous sample ice matrix production fo...
Patent number
5,171,989
Issue date
Dec 15, 1992
Board of Trustees of Leland Stanford Jr. University
Evan R. Williams
G01 - MEASURING TESTING
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Patent Grant
Surface induced dissociation with reflectron time-of-flight mass sp...
Patent number
5,144,127
Issue date
Sep 1, 1992
Evan R. Williams
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Hadamard transform measurement of MSN Fourier-transform mass spectra
Patent number
4,978,852
Issue date
Dec 18, 1990
Cornell Research Foundation, Inc.
Evan R. Williams
H01 - BASIC ELECTRIC ELEMENTS