Evelio Sevillano

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods for detecting endpoint for through-silicon via reveal appli...
- Patent number 9,941,178
- Issue date Apr 10, 2018
- Lam Research Corporation
- Alan Jeffrey Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for detecting endpoint for through-silicon via...
- Patent number 9,543,225
- Issue date Jan 10, 2017
- Lam Research Corporation
- Alan Jeffrey Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Differential measurements for endpoint signal enhancement
- Patent number 8,900,470
- Issue date Dec 2, 2014
- Lam Research Corporation
- Evelio Sevillano
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Methods for Detecting Endpoint for Through-Silicon Via Reveal Appli...
- Publication number 20170062290
- Publication date Mar 2, 2017
- LAM RESEARCH CORPORATION
- Alan Jeffrey Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING ENDPOINT FOR THROUGH-SILICON VIA...
- Publication number 20150311129
- Publication date Oct 29, 2015
- LAM RESEARCH CORPORATION
- Alan Jeffrey Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFERENTIAL MEASUREMENTS FOR ENDPOINT SIGNAL ENHANCEMENT
- Publication number 20140106476
- Publication date Apr 17, 2014
- LAM RESEARCH CORPORATION
- Evelio SEVILLANO
- H01 - BASIC ELECTRIC ELEMENTS