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Evgeny BAL
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Natanya, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Mask inspection of a semiconductor specimen
Patent number
11,983,867
Issue date
May 14, 2024
Applied Materials Israel Ltd.
Ariel Shkalim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Determining a critical dimension variation of a pattern
Patent number
11,756,188
Issue date
Sep 12, 2023
Applied Materials Israel Ltd.
Vadim Vereschagin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Mask inspection of a semiconductor specimen
Patent number
11,348,224
Issue date
May 31, 2022
Applied Materials Israel Ltd.
Ariel Shkalim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Determining a critical dimension variation of a pattern
Patent number
11,276,160
Issue date
Mar 15, 2022
Applied Materials Israel Ltd.
Vadim Vereschagin
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION
Publication number
20230080151
Publication date
Mar 16, 2023
APPLIED MATERIALS ISRAEL LTD.
Ariel SHKALIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
Publication number
20220254000
Publication date
Aug 11, 2022
APPLIED MATERIALS ISRAEL LTD.
Ariel SHKALIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN
Publication number
20220198639
Publication date
Jun 23, 2022
APPLIED MATERIALS ISRAEL LTD.
Vadim VERESCHAGIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
Publication number
20210073963
Publication date
Mar 11, 2021
APPLIED MATERIALS ISRAEL LTD.
Ariel SHKALIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN
Publication number
20200327652
Publication date
Oct 15, 2020
APPLIED MATERIALS ISRAEL LTD.
Vadim VERESCHAGIN
G06 - COMPUTING CALCULATING COUNTING