Ewald Moersen

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Mainz, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method of determining local structures in optical crystals
- Patent number 6,989,904
- Issue date Jan 24, 2006
- Schott AG
- Ewald Moersen
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for growing large-volume oriented monocrystals
- Patent number 6,969,502
- Issue date Nov 29, 2005
- Schott Glas
- Gunther Wehrhan
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for analysis of schlieren
- Patent number 6,891,980
- Issue date May 10, 2005
- Schott Glas
- Michael Gerhard
- G01 - MEASURING TESTING
Information Patent Grant
Optical system with compensated spatial dispersion
- Patent number 6,816,326
- Issue date Nov 9, 2004
- Schott Glas
- Kurt Nattermann
- G02 - OPTICS
Information Patent Grant
Method of making a fracture-resistant calcium fluoride single cryst...
- Patent number 6,740,159
- Issue date May 25, 2004
- Schott Glas
- Joerg Kandler
- G02 - OPTICS
Information Patent Grant
Method for determination of the radiation stability of crystals
- Patent number 6,603,547
- Issue date Aug 5, 2003
- Schott Glas
- Ewald Moersen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of determining local structures in optical crystals
- Publication number 20040021803
- Publication date Feb 5, 2004
- Ewald Moersen
- G01 - MEASURING TESTING
Information Patent Application
Optical system with compensated spatial dispersion
- Publication number 20040008427
- Publication date Jan 15, 2004
- Kurt Nattermann
- G02 - OPTICS
Information Patent Application
Method of making a fracture-resistant calcium fluoride single cryst...
- Publication number 20030101923
- Publication date Jun 5, 2003
- Joerg Kandler
- C30 - CRYSTAL GROWTH
Information Patent Application
Method and device for growing large-volume oriented monocrystals
- Publication number 20030089307
- Publication date May 15, 2003
- Gunther Wehrhan
- C30 - CRYSTAL GROWTH
Information Patent Application
Method and apparatus for analysis of schlieren
- Publication number 20020154814
- Publication date Oct 24, 2002
- Michael Gerhard
- G01 - MEASURING TESTING
Information Patent Application
Method for determination of the radiation stability of crystals
- Publication number 20020105643
- Publication date Aug 8, 2002
- Ewald Moersen
- G01 - MEASURING TESTING