Eyal Grubner

Person

  • Holon, IL

Patents Grantslast 30 patents

  • Information Patent Grant

    Scatterometry system and method

    • Patent number 11,900,028
    • Issue date Feb 13, 2024
    • Nova Ltd.
    • Ruslan Berdichevsky
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Scatterometry system and method

    • Patent number 10,970,435
    • Issue date Apr 6, 2021
    • Nova Measuring Instruments Ltd.
    • Ruslan Berdichevsky
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Scatterometry system and method

    • Patent number 10,372,845
    • Issue date Aug 6, 2019
    • Nova Measuring Instruments Ltd.
    • Ruslan Berdichevsky
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SCATTEROMETRY SYSTEM AND METHOD

    • Publication number 20210294942
    • Publication date Sep 23, 2021
    • NOVA MEASURING INSTRUMENTS LTD.
    • RUSLAN BERDICHEVSKY
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCATTEROMETRY SYSTEM AND METHOD

    • Publication number 20200019658
    • Publication date Jan 16, 2020
    • NOVA MEASURING INSTRUMENTS LTD.
    • RUSLAN BERDICHEVSKY
    • G01 - MEASURING TESTING