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Eyal Salomon
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Rishon Le Zion, IL
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last 30 patents
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Patent Grant
Method and device for high speed testing of an integrated circuit
Patent number
7,689,897
Issue date
Mar 30, 2010
FREESCALE SEMICONDUCTOR, INC.
Michael Priel
G01 - MEASURING TESTING
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Patent Grant
Binary rate multiplier
Patent number
6,076,096
Issue date
Jun 13, 2000
Motorola Inc.
Eyal Salomon
G06 - COMPUTING CALCULATING COUNTING