Ezequiel Vidal Russell

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Boise, ID, US

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Patents Grantslast 30 patents

Information Patent Grant
Photomasks, methods of forming a photomask, and methods of photolit...
- Patent number 9,075,317
- Issue date Jul 7, 2015
- Micron Technology, Inc.
- Fei Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Photomasks, methods of forming a photomask, and methods of photolit...
- Patent number 8,846,273
- Issue date Sep 30, 2014
- Micron Technology, Inc.
- Fei Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods for defining evaluation points for optical proximity correc...
- Patent number 8,584,058
- Issue date Nov 12, 2013
- Micron Technology, Inc.
- John R. C. Futrell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods for defining evaluation points for optical proximity correc...
- Patent number 8,037,446
- Issue date Oct 11, 2011
- Micron Technology, Inc.
- John R. C. Futrell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Photomasks, Methods Of Forming A Photomask, And Methods Of Photolit...
- Publication number 20150017575
- Publication date Jan 15, 2015
- Micron Technology, Inc.
- Fei Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Photomasks, Methods Of Forming A Photomask, And Methods Of Photolit...
- Publication number 20130323627
- Publication date Dec 5, 2013
- Micron Technology, Inc.
- Fei Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS FOR DEFINING EVALUATION POINTS FOR OPTICAL PROXIMITY CORREC...
- Publication number 20120030638
- Publication date Feb 2, 2012
- Micron Technology, Inc.
- John R. C. Futrell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS FOR DEFINING EVALUATION POINTS FOR OPTICAL PROXIMITY CORREC...
- Publication number 20100017778
- Publication date Jan 21, 2010
- Micron Technology, Inc.
- John R. C. Futrell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY