Ezra Baruch

Person

Herzelia, IL

People

Patents Grantslast 30 patents

Information Patent Grant
On-die capacitance measurement module and method for measuring an o...
- Patent number 9,459,297
- Issue date Oct 4, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Ezra Baruch
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for testing integrated circuits
- Patent number 8,030,953
- Issue date Oct 4, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Ezra Baruch
- G01 - MEASURING TESTING
Information Patent Grant
Tester and a method for testing an integrated circuit
- Patent number 8,008,935
- Issue date Aug 30, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Ezra Baruch
- G01 - MEASURING TESTING
Information Patent Grant
Analysis module, integrated circuit, system and method for testing...
- Patent number 7,151,387
- Issue date Dec 19, 2006
- FREESCALE SEMICONDUCTOR, INC.
- Yoav Weizman
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus with failure recovery and method therefore
- Patent number 6,226,556
- Issue date May 1, 2001
- Motorola Inc.
- Yuval Itkin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer system with interface and method
- Patent number 6,182,181
- Issue date Jan 30, 2001
- Motorola, Inc.
- Ezra Baruch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interface with selector receiving control words comprising device i...
- Patent number 6,157,968
- Issue date Dec 5, 2000
- Motorola Inc.
- Ezra Baruch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer system with trigger controlled interface and method
- Patent number 6,125,413
- Issue date Sep 26, 2000
- Motorola, Inc.
- Ezra Baruch
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ON-DIE CAPACITANCE MEASUREMENT MODULE AND METHOD FOR MEASURING AN O...
- Publication number 20140333327
- Publication date Nov 13, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Ezra Baruch
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TESTING INTEGRATED CIRCUITS
- Publication number 20090195265
- Publication date Aug 6, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Ezra Baruch
- G01 - MEASURING TESTING
Information Patent Application
Analysis module, integrated circuit, system and method for testing...
- Publication number 20040064772
- Publication date Apr 1, 2004
- Yoav Weizman
- G01 - MEASURING TESTING

Ezra Baruch

Person

Patents Grantslast 30 patents

On-die capacitance measurement module and method for measuring an o...

Device and method for testing integrated circuits

Tester and a method for testing an integrated circuit

Analysis module, integrated circuit, system and method for testing...

Apparatus with failure recovery and method therefore

Computer system with interface and method

Interface with selector receiving control words comprising device i...

Computer system with trigger controlled interface and method

Patents Applicationslast 30 patents

ON-DIE CAPACITANCE MEASUREMENT MODULE AND METHOD FOR MEASURING AN O...

DEVICE AND METHOD FOR TESTING INTEGRATED CIRCUITS

Analysis module, integrated circuit, system and method for testing...