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Patents Grantslast 30 patents

Information Patent Grant
Advanced in-situ particle detection system for semiconductor substr...
- Patent number 10,883,932
- Issue date Jan 5, 2021
- Applied Materials, Inc.
- Lin Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Advanced in-situ particle detection system for semiconductor substr...
- Patent number 10,365,216
- Issue date Jul 30, 2019
- Applied Materials, Inc.
- Lin Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADVANCED IN-SITU PARTICLE DETECTION SYSTEM FOR SEMICONDUCTOR SUBSTR...
- Publication number 20190323960
- Publication date Oct 24, 2019
- Applied Materials, Inc.
- Lin ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADVANCED IN-SITU PARTICLE DETECTION SYSTEM FOR SEMICONDUCTOR SUBSTR...
- Publication number 20180156727
- Publication date Jun 7, 2018
- Applied Materials, Inc.
- Lin ZHANG
- G01 - MEASURING TESTING