Fabio A. Faccini

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Control by sample reflectivity
- Patent number 7,903,250
- Issue date Mar 8, 2011
- KLA-Tencor Corporation
- Fabio A. Faccini
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometry measurement and analysis
- Patent number 7,453,562
- Issue date Nov 18, 2008
- KLA-Tencor Corporation
- Torsten R. Kaack
- G01 - MEASURING TESTING