Fabio Duarte De Martin

Person

Campinas, BR

People

Patents Grantslast 30 patents

Information Patent Grant
Test structure activated by probe needle
- Patent number 9,645,196
- Issue date May 9, 2017
- NXP USA, INC.
- Fabio Duarte De Martin
- G01 - MEASURING TESTING
Information Patent Grant
Probing structure for evaluation of slow slew-rate square wave sign...
- Patent number 8,779,790
- Issue date Jul 15, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Andre Luis L. Vilas Boas
- G01 - MEASURING TESTING
Information Patent Grant
Process of forming an electronic device including a resistor-capaci...
- Patent number 8,629,530
- Issue date Jan 14, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Fabio Duarte de Martin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge pump voltage regulator
- Patent number 8,519,780
- Issue date Aug 27, 2013
- FREESCALE SEMICONDUCTOR, INC.
- André Luis Vilas Boas
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Test structure activated by probe needle
- Patent number 8,339,152
- Issue date Dec 25, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Fabio Duarte De Martin
- G01 - MEASURING TESTING
Information Patent Grant
Process of forming an electronic device including a resistor-capaci...
- Patent number 8,017,474
- Issue date Sep 13, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Fabio Duarte de Martin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
BREACH DETECTION IN INTEGRATED CIRCUITS
- Publication number 20180018125
- Publication date Jan 18, 2018
- FREESCALE SEMICONDUCTOR, INC.
- Fabio Duarte De Martin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGE PUMP VOLTAGE REGULATOR
- Publication number 20130200943
- Publication date Aug 8, 2013
- FREESCALE SEMICONDUCTOR, INC.
- André Luis VILAS BOAS
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TEST STRUCTURE ACTIVATED BY PROBE NEEDLE
- Publication number 20130082726
- Publication date Apr 4, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Fabio DUARTE DE MARTIN
- G01 - MEASURING TESTING
Information Patent Application
PROCESS OF FORMING AN ELECTRONIC DEVICE INCLUDING A RESISTOR-CAPACI...
- Publication number 20110309419
- Publication date Dec 22, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Fabio Duarte de Martin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE ACTIVATED BY PROBE NEEDLE
- Publication number 20110241713
- Publication date Oct 6, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Fabio Duarte De Martin
- G01 - MEASURING TESTING
Information Patent Application
Probing Structure for Evaluation of Slow Slew-Rate Square Wave Sign...
- Publication number 20100327893
- Publication date Dec 30, 2010
- Andre Luis L. Vilas Boas
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE INCLUDING A RESISTOR-CAPACITOR FILTER AND A PROCE...
- Publication number 20090302364
- Publication date Dec 10, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Fabio Duarte de Martin
- H01 - BASIC ELECTRIC ELEMENTS

Fabio Duarte De Martin

Person

Patents Grantslast 30 patents

Test structure activated by probe needle

Probing structure for evaluation of slow slew-rate square wave sign...

Process of forming an electronic device including a resistor-capaci...

Charge pump voltage regulator

Test structure activated by probe needle

Process of forming an electronic device including a resistor-capaci...

Patents Applicationslast 30 patents

BREACH DETECTION IN INTEGRATED CIRCUITS

CHARGE PUMP VOLTAGE REGULATOR

TEST STRUCTURE ACTIVATED BY PROBE NEEDLE

PROCESS OF FORMING AN ELECTRONIC DEVICE INCLUDING A RESISTOR-CAPACI...

TEST STRUCTURE ACTIVATED BY PROBE NEEDLE

Probing Structure for Evaluation of Slow Slew-Rate Square Wave Sign...

ELECTRONIC DEVICE INCLUDING A RESISTOR-CAPACITOR FILTER AND A PROCE...