Fahad Ahmed

Person

San Diego, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Byte enable memory built-in self-test (MBIST) algorithm
- Patent number 10,748,641
- Issue date Aug 18, 2020
- QUALCOMM Incorporated
- Greg Seok
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory repair enablement
- Patent number 10,713,136
- Issue date Jul 14, 2020
- QUALCOMM Incorporated
- Fahad Ahmed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High-speed level shifter
- Patent number 9,997,208
- Issue date Jun 12, 2018
- QUALCOMM Incorporated
- Chulmin Jung
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Timed sense amplifier circuits and methods in a semiconductor memory
- Patent number 9,959,912
- Issue date May 1, 2018
- QUALCOMM Incorporated
- Chulmin Jung
- G11 - INFORMATION STORAGE
Information Patent Grant
Write driver circuitry to reduce leakage of negative boost charge
- Patent number 9,916,892
- Issue date Mar 13, 2018
- QUALCOMM Incorporated
- Pradeep Raj
- G11 - INFORMATION STORAGE
Information Patent Grant
Write data path to reduce charge leakage of negative boost
- Patent number 9,865,337
- Issue date Jan 9, 2018
- QUALCOMM Incorporated
- Fahad Ahmed
- G11 - INFORMATION STORAGE
Information Patent Grant
Shared sense amplifier
- Patent number 9,640,231
- Issue date May 2, 2017
- QUALCOMM Incorporated
- Fahad Ahmed
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with a voltage-adjustment circuit to adjust the operating vo...
- Patent number 9,627,041
- Issue date Apr 18, 2017
- QUALCOMM Incorporated
- Chulmin Jung
- G11 - INFORMATION STORAGE
Information Patent Grant
Write driver for memory
- Patent number 9,401,201
- Issue date Jul 26, 2016
- QUALCOMM Incorporated
- Chulmin Jung
- G11 - INFORMATION STORAGE
Information Patent Grant
Sense amplifier with pulsed control for pull-up transistors
- Patent number 9,373,388
- Issue date Jun 21, 2016
- QUALCOMM Incorporated
- Fahad Ahmed
- G11 - INFORMATION STORAGE
Information Patent Grant
Write-assisted memory with enhanced speed
- Patent number 9,224,453
- Issue date Dec 29, 2015
- QUALCOMM Incorporated
- Peng Jin
- G11 - INFORMATION STORAGE
Information Patent Grant
Process tolerant circuits
- Patent number 9,019,751
- Issue date Apr 28, 2015
- QUALCOMM Incorporated
- Peng Jin
- G05 - CONTROLLING REGULATING
Information Patent Grant
Process corner sensor for bit-cells
- Patent number 8,976,574
- Issue date Mar 10, 2015
- QUALCOMM Incorporated
- Fahad Ahmed
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
BYTE ENABLE MEMORY BUILT-IN SELF-TEST (MBIST) ALGORITHM
- Publication number 20190115091
- Publication date Apr 18, 2019
- QUALCOMM Incorporated
- Greg Seok
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY REPAIR ENABLEMENT
- Publication number 20190095295
- Publication date Mar 28, 2019
- QUALCOMM Incorporated
- Fahad AHMED
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIMED SENSE AMPLIFIER CIRCUITS AND METHODS IN A SEMICONDUCTOR MEMORY
- Publication number 20170221551
- Publication date Aug 3, 2017
- QUALCOMM Incorporated
- Chulmin JUNG
- G11 - INFORMATION STORAGE
Information Patent Application
Write-Assisted Memory with Enhanced Speed
- Publication number 20140269018
- Publication date Sep 18, 2014
- QUALCOMM Incorporated
- Peng Jin
- G11 - INFORMATION STORAGE
Information Patent Application
PROCESS CORNER SENSOR FOR BIT-CELLS
- Publication number 20140269017
- Publication date Sep 18, 2014
- QUALCOMM Incorporated
- Fahad Ahmed
- G11 - INFORMATION STORAGE
Information Patent Application
PROCESS TOLERANT CIRCUITS
- Publication number 20140247652
- Publication date Sep 4, 2014
- QUALCOMM Incorporated
- Peng Jin
- G11 - INFORMATION STORAGE

Fahad Ahmed

Person

Patents Grantslast 30 patents

Byte enable memory built-in self-test (MBIST) algorithm

Memory repair enablement

High-speed level shifter

Timed sense amplifier circuits and methods in a semiconductor memory

Write driver circuitry to reduce leakage of negative boost charge

Write data path to reduce charge leakage of negative boost

Shared sense amplifier

Memory with a voltage-adjustment circuit to adjust the operating vo...

Write driver for memory

Sense amplifier with pulsed control for pull-up transistors

Write-assisted memory with enhanced speed

Process tolerant circuits

Process corner sensor for bit-cells

Patents Applicationslast 30 patents

BYTE ENABLE MEMORY BUILT-IN SELF-TEST (MBIST) ALGORITHM

MEMORY REPAIR ENABLEMENT

TIMED SENSE AMPLIFIER CIRCUITS AND METHODS IN A SEMICONDUCTOR MEMORY

Write-Assisted Memory with Enhanced Speed

PROCESS CORNER SENSOR FOR BIT-CELLS

PROCESS TOLERANT CIRCUITS