Fan-Hsien Hsu

Person

  • Hsinchu County, TW

Patents Grantslast 30 patents

  • Information Patent Grant

    Probe system

    • Patent number 7,449,902
    • Issue date Nov 11, 2008
    • Powerchip Semiconductor Corp.
    • Fan-Hsien Hsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe apparatus

    • Patent number 7,298,154
    • Issue date Nov 20, 2007
    • Powerchip Semiconductor Corp.
    • Fan-Hsien Hsu
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE SYSTEM

    • Publication number 20090066349
    • Publication date Mar 12, 2009
    • POWERCHIP SEMICONDUCTOR CORP.
    • Fan-Hsien Hsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE SYSTEM

    • Publication number 20070229108
    • Publication date Oct 4, 2007
    • POWERCHIP SEMICONDUCTOR CORP.
    • Fan-Hsien Hsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS

    • Publication number 20070115011
    • Publication date May 24, 2007
    • Fan-Hsien Hsu
    • G01 - MEASURING TESTING