Fan LAN

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Patents Grantslast 30 patents

Information Patent Grant
Addressable test chip test system
- Patent number 11,959,964
- Issue date Apr 16, 2024
- SEMITRONIX CORPORATION
- Jiabai Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Addressable test chip
- Patent number 11,668,748
- Issue date Jun 6, 2023
- SEMITRONIX CORPORATION
- Fan Lan
- G01 - MEASURING TESTING
Information Patent Grant
Addressable test system with address register
- Patent number 11,243,251
- Issue date Feb 8, 2022
- SEMITRONIX CORPORATION
- Fan Lan
- G01 - MEASURING TESTING
Information Patent Grant
Addressable test chip with sensing circuit
- Patent number 10,725,102
- Issue date Jul 28, 2020
- SEMITRONIX CORPORATION
- Fan Lan
- G01 - MEASURING TESTING
Information Patent Grant
Addressable test chip with multiple-stage transmission gates
- Patent number 10,725,101
- Issue date Jul 28, 2020
- SEMITRONIX CORPORATION
- Fan Lan
- G01 - MEASURING TESTING
Information Patent Grant
Addressable test chip test system
- Patent number 10,254,339
- Issue date Apr 9, 2019
- SEMITRONIX CORPORATION
- Fan Lan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADDRESSABLE TEST CHIP TEST SYSTEM
- Publication number 20230324458
- Publication date Oct 12, 2023
- Semitronix Corporation
- Jiabai CHENG
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE TEST CHIP
- Publication number 20220146573
- Publication date May 12, 2022
- Semitronix Corporation
- Fan LAN
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE TEST SYSTEM WITH ADDRESS REGISTER
- Publication number 20200355742
- Publication date Nov 12, 2020
- Semitronix Corporation
- Fan LAN
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE TEST CHIP WITH MULTIPLE-STAGE TRANSMISSION GATES
- Publication number 20190235021
- Publication date Aug 1, 2019
- Semitronix Corporation
- Fan LAN
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE TEST CHIP WITH SENSING CIRCUIT
- Publication number 20190235022
- Publication date Aug 1, 2019
- Semitronix Corporation
- Fan LAN
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE TEST CHIP TEST SYSTEM
- Publication number 20180188324
- Publication date Jul 5, 2018
- Semitronix Corporation
- Fan LAN
- G01 - MEASURING TESTING