Fang Lin

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Zhubei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Wafer surface conditioning for stability in fab environment
- Patent number 9,847,302
- Issue date Dec 19, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tsiao-Chen Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation method of semiconductor device that includes performing h...
- Patent number 9,558,955
- Issue date Jan 31, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ru-Shang Hsiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra-high oxide to photoresist selective etch of high-aspect-ratio...
- Patent number 6,486,070
- Issue date Nov 26, 2002
- Lam Research Corporation
- Chok W. Ho
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE WITH METAL G...
- Publication number 20160225630
- Publication date Aug 4, 2016
- Taiwan Semiconductor Manufacturing Co., LTD
- Ru-Shang HSIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer Surface Conditioning for Stability in Fab Environment
- Publication number 20150054142
- Publication date Feb 26, 2015
- Taiwan Semiconductor Manufacturing Co., LTD
- Tsaio-Chen Wu
- H01 - BASIC ELECTRIC ELEMENTS