Fang Zhou

Person

Pliening/Landsham, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Beam current calibration system
- Patent number 7,982,179
- Issue date Jul 19, 2011
- ICT Intergrated Circuit Testing Gesellschaft für Halbeiterprüftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter for cold field emission electron beam apparatus
- Patent number 7,919,749
- Issue date Apr 5, 2011
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Fang Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for selecting an emission area of an emission pat...
- Patent number 7,847,266
- Issue date Dec 7, 2010
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Fang Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam emitting device and method for operating a ch...
- Patent number 7,595,490
- Issue date Sep 29, 2009
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Fang Zhou
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
BEAM CURRENT CALIBRATION SYSTEM
- Publication number 20090200497
- Publication date Aug 13, 2009
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENERGY FILTER FOR COLD FIELD EMISSION ELECTRON BEAM APPARATUS
- Publication number 20090101819
- Publication date Apr 23, 2009
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- FANG ZHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMITTER CHAMBER, CHARGED PARTICAL APPARATUS AND METHOD FOR OPERATIN...
- Publication number 20080283745
- Publication date Nov 20, 2008
- ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik mbH
- Pavel ADAMEC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM EMITTING DEVICE AND METHOD FOR OPERATING A CH...
- Publication number 20070158588
- Publication date Jul 12, 2007
- Fang Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR SELECTING AN EMISSION AREA OF AN EMISSION PAT...
- Publication number 20070085018
- Publication date Apr 19, 2007
- Fang Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Field emitter arrangement and method of cleansing an emitting surfa...
- Publication number 20070018562
- Publication date Jan 25, 2007
- ICT. INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUR HALBLEITERPRUFTECHNIK MBH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTINUOUSLY CLEANING OF THE EMISSION SURFACE OF A COLD FIELD EMISS...
- Publication number 20070001574
- Publication date Jan 4, 2007
- FANG ZHOU
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Beam current calibration system

Energy filter for cold field emission electron beam apparatus

Device and method for selecting an emission area of an emission pat...

Charged particle beam emitting device and method for operating a ch...

Patents Applicationslast 30 patents

BEAM CURRENT CALIBRATION SYSTEM

ENERGY FILTER FOR COLD FIELD EMISSION ELECTRON BEAM APPARATUS

EMITTER CHAMBER, CHARGED PARTICAL APPARATUS AND METHOD FOR OPERATIN...

CHARGED PARTICLE BEAM EMITTING DEVICE AND METHOD FOR OPERATING A CH...

DEVICE AND METHOD FOR SELECTING AN EMISSION AREA OF AN EMISSION PAT...

Field emitter arrangement and method of cleansing an emitting surfa...

CONTINUOUSLY CLEANING OF THE EMISSION SURFACE OF A COLD FIELD EMISS...