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Fariborz Agahdel
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Los Gatos, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Probe card test apparatus and method
Patent number
8,531,202
Issue date
Sep 10, 2013
VeraConnex, LLC
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Grant
Probe card repair using coupons with spring contacts and separate a...
Patent number
7,876,087
Issue date
Jan 25, 2011
Innoconnex, Inc.
Sammy Mok
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Non-destructive interconnect system for semiconductor devices
Patent number
5,468,157
Issue date
Nov 21, 1995
Texas Instruments Incorporated
Randal D. Roebuck
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Probe Card Test Apparatus And Method
Publication number
20100213960
Publication date
Aug 26, 2010
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Application
Compliance partitioning in testing of integrated circuits
Publication number
20080061808
Publication date
Mar 13, 2008
Sammy Mok
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...