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Farid Labib
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Diessen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Transistor cell for integrated circuits and method to form same
Patent number
11,329,129
Issue date
May 10, 2022
GLOBALFOUNDRIES U.S. INC.
Stefan G. Block
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test pin gating for dynamic optimization
Patent number
8,078,926
Issue date
Dec 13, 2011
LSI Corporation
Stefan G. Block
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TRANSISTOR CELL FOR INTEGRATED CIRCUITS AND METHOD TO FORM SAME
Publication number
20210159313
Publication date
May 27, 2021
GLOBALFOUNDRIES U.S. Inc.
Stefan G. Block
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Delay-Cell Footprint-Compatible Buffers
Publication number
20110320997
Publication date
Dec 29, 2011
LSI Corporation
Farid Labib
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Test Pin Gating for Dynamic Optimization
Publication number
20110066905
Publication date
Mar 17, 2011
LSI Corporation
Stefan G. Block
G01 - MEASURING TESTING