Farideh Golshan

Person

Mountain View, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing and debugging a circuit
- Patent number 6,751,764
- Issue date Jun 15, 2004
- Sun Microsystems, Inc.
- Farideh Golshan
- G01 - MEASURING TESTING
Information Patent Grant
Internally generated vectors for burnin system
- Patent number 6,675,338
- Issue date Jan 6, 2004
- Sun Microsystems, Inc.
- Farideh Golshan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for on-line circuit debug using JTAG and shadow scan in a mi...
- Patent number 6,671,841
- Issue date Dec 30, 2003
- Sun Microsystems, Inc.
- Farideh Golshan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for on-line circuit debug using JTAG and shadow scan in a...
- Patent number 6,662,325
- Issue date Dec 9, 2003
- Sun Microsystems, Inc.
- Farideh Golshan
- G11 - INFORMATION STORAGE
Information Patent Grant
Multiplexer select line exclusivity check method and apparatus
- Patent number 6,581,018
- Issue date Jun 17, 2003
- Sun Microsystems, Inc.
- Farideh Golshan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for interfacing boundary-scan circuitry with D...
- Patent number 6,219,812
- Issue date Apr 17, 2001
- Sun Microsystems, Inc.
- Farideh Golshan
- G01 - MEASURING TESTING
Information Patent Grant
Boundary-scan circuit for use with linearized impedance control typ...
- Patent number 5,892,778
- Issue date Apr 6, 1999
- Sun Microsystems, Inc.
- Farideh Golshan
- G01 - MEASURING TESTING
Information Patent Grant
Method for interfacing boundary-scan circuitry with linearized impe...
- Patent number 5,872,796
- Issue date Feb 16, 1999
- Sun Microsystems, Inc.
- Farideh Golshan
- G01 - MEASURING TESTING

Farideh Golshan

Person

Patents Grantslast 30 patents

Method and apparatus for testing and debugging a circuit

Internally generated vectors for burnin system

Method for on-line circuit debug using JTAG and shadow scan in a mi...

Apparatus for on-line circuit debug using JTAG and shadow scan in a...

Multiplexer select line exclusivity check method and apparatus

Apparatus and method for interfacing boundary-scan circuitry with D...

Boundary-scan circuit for use with linearized impedance control typ...

Method for interfacing boundary-scan circuitry with linearized impe...