Yorktown, VA, US
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Patent Grant
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
Farzin Amzajerdian
G01 - MEASURING TESTING
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Patent Grant
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF THE NASA
George E. Busch
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Diego F. Pierrottet
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Farzin Amzajerdian
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America as represented by the administrator of the Natio...
Diego F. Pierrottet
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
The United States of America as represented by the administrator of the Natio...
Michael D. Vanek
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Michael J. Kavaya
G01 - MEASURING TESTING
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Patent Application
United States of America as represented by the Administrator of NASA
DIEGO F. PIERROTTET
G01 - MEASURING TESTING
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Patent Application
U.S.A. as represented by the Administrator of the National Aeronautics and Sp...
GEORGE E. BUSCH
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
USA as represented by the Administrator of the National Aeronautics and Space...
Diego F. Pierrottet
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
USA as represented by the Administrator of the National Aeronautics and Space...
Diego F. Pierrottet
G01 - MEASURING TESTING
Information
Patent Application
USA as represented by the Administrator of the National Aeronautics and Space...
Farzin Amzajerdian
G01 - MEASURING TESTING
Information
Patent Application
Michael D. Vanek
G06 - COMPUTING CALCULATING COUNTING
