Fatima Anis

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for wafer-by-wafer overlay feedforward and lot-to...
- Patent number 11,221,561
- Issue date Jan 11, 2022
- KLA Corporation
- Onur Nihat Demirer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems and methods for automated multi-zone detection and modeling
- Patent number 10,340,165
- Issue date Jul 2, 2019
- KLA-Tencor Corporation
- Jeremy Nabeth
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY SAMPLING PLANS FOR ONLY OUT OF SPECIFICATION DETECTION
- Publication number 20240038558
- Publication date Feb 1, 2024
- KLA Corporation
- Fatima Anis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Wafer-By-Wafer Overlay Feedforward and Lot-To...
- Publication number 20210216021
- Publication date Jul 15, 2021
- KLA Corporation
- Onur Nihat Demirer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Systems and Methods for Automated Multi-Zone Detection and Modeling
- Publication number 20170287754
- Publication date Oct 5, 2017
- KLA-Tencor Corporation
- Jeremy Nabeth
- G01 - MEASURING TESTING