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Fei Wang
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Low dose charged particle metrology system
Patent number
11,720,030
Issue date
Aug 8, 2023
ASML Netherlands B.V.
Fei Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low dose charged particle metrology system
Patent number
11,175,590
Issue date
Nov 16, 2021
ASML Netherlands B.V.
Fei Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Local alignment point calibration method in die inspection
Patent number
11,043,356
Issue date
Jun 22, 2021
ASML Netherlands B.V.
Wei Fang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for accelerating data reconstruction for a dis...
Patent number
10,585,770
Issue date
Mar 10, 2020
EMC IP Holding Company LLC
Alan Zhongjie Wu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Local alignment point calibration method in die inspection
Patent number
10,497,538
Issue date
Dec 3, 2019
ASML Netherlands B.V.
Wei Fang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Local alignment point calibration method in die inspection
Patent number
9,953,803
Issue date
Apr 24, 2018
Hermes Microvision Inc.
Wei Fang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Performance of de-clustered disk array by disk grouping based on I/...
Patent number
9,798,471
Issue date
Oct 24, 2017
EMC IP Holding Compnay LLC
Alan Zhongjie Wu
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
LOW DOSE CHARGED PARTICLE METROLOGY SYSTEM
Publication number
20220113637
Publication date
Apr 14, 2022
ASML NETHERLANDS B.V.
Fei WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LOW DOSE CHARGED PARTICLE METROLOGY SYSTEM
Publication number
20200333714
Publication date
Oct 22, 2020
ASML NETHERLANDS B.V.
Fei WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Local Alignment Point Calibration Method in Die Inspection
Publication number
20200105497
Publication date
Apr 2, 2020
ASML NETHERLANDS B.V.
Wei FANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Local Alignment Point Calibration Method in Die Inspection
Publication number
20180247789
Publication date
Aug 30, 2018
Hermes Microvision Inc.
Wei FANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Local Alignment Point Calibration Method in Die Inspection
Publication number
20160247660
Publication date
Aug 25, 2016
HERMES MICROVISION INC.
Wei Fang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR ACCELERATING DATA RECONSTRUCTION FOR A DIS...
Publication number
20160092326
Publication date
Mar 31, 2016
EMC Corporation
Alan Zhongjie Wu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PERFORMANCE OF DE-CLUSTERED DISK ARRAY
Publication number
20160092109
Publication date
Mar 31, 2016
EMC Corporation
Alan Zhongjie Wu
G06 - COMPUTING CALCULATING COUNTING