Feiyang Wu

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San Francisco, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Electrode for use in measuring dielectric properties of parts
- Patent number 9,322,795
- Issue date Apr 26, 2016
- Lam Research Corporation
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Electrode for use in measuring dielectric properties of parts
- Patent number 8,519,724
- Issue date Aug 27, 2013
- Lam Research Corporation
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring dielectric properties of parts
- Patent number 8,269,510
- Issue date Sep 18, 2012
- Lam Research Corporation
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Methods for measuring dielectric properties of parts
- Patent number 7,973,539
- Issue date Jul 5, 2011
- Lam Research Corporation
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Methods for measuring dielectric properties of parts
- Patent number 7,911,213
- Issue date Mar 22, 2011
- Lam Research Corporation
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Methods for characterizing dielectric properties of parts
- Patent number 7,777,500
- Issue date Aug 17, 2010
- Lam Research Corporation
- Jaehyun Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electrode for Use in Measuring Dielectric Properties of Parts
- Publication number 20130241581
- Publication date Sep 19, 2013
- LAM RESEARCH CORPORATION
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR MEASURING DIELECTRIC PROPERTIES OF PARTS
- Publication number 20110140715
- Publication date Jun 16, 2011
- LAM RESEARCH CORPORATION
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Application
Methods for Measuring Dielectric Properties of Parts
- Publication number 20100079152
- Publication date Apr 1, 2010
- LAM RESEARCH CORPORATION
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Application
Methods for Characterizing Dielectric Properties of Parts
- Publication number 20090091335
- Publication date Apr 9, 2009
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Application
Electrode for Use in Measuring Dielectric Properties of Parts
- Publication number 20090091341
- Publication date Apr 9, 2009
- LAM RESEARCH CORPORATION
- Jaehyun Kim
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for Measuring Dielectric Properties of Parts
- Publication number 20090091340
- Publication date Apr 9, 2009
- LAM RESEARCH CORPORATION
- Jaehyun Kim
- G01 - MEASURING TESTING