Felix Beaudoin

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Union City, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and installation for analyzing an integrated circuit
- Patent number 7,560,940
- Issue date Jul 14, 2009
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic-field-measuring device
- Patent number 7,417,424
- Issue date Aug 26, 2008
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Installation for Analyzing an Integrated Circuit
- Publication number 20080088324
- Publication date Apr 17, 2008
- CENTRE NATIONAL D'ETUDES SPATIALES
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Magnetic-field-measuring probe
- Publication number 20070132464
- Publication date Jun 14, 2007
- Centre National D'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Magnetic-field-measuring probe
- Publication number 20070108975
- Publication date May 17, 2007
- CENTRE NATIONALE D' ETUDES
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Magnetic-field-measuring device
- Publication number 20070052412
- Publication date Mar 8, 2007
- Centre National D'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING