Felix Beaudoin

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Baziege, FR

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Patents Grantslast 30 patents

Information Patent Grant
Magnetic-field-measuring probe
- Patent number 7,411,391
- Issue date Aug 12, 2008
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring a component of current based on magnetic fields
- Patent number 7,408,342
- Issue date Aug 5, 2008
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Spatial and temporal selective laser assisted fault localization
- Patent number 6,967,491
- Issue date Nov 22, 2005
- Credence Systems Corporation
- Philippe Perdu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Spatial and temporal selective laser assisted fault localization
- Publication number 20050006602
- Publication date Jan 13, 2005
- Philippe Perdu
- G01 - MEASURING TESTING