Felix Kerstan

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Jena, DD

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Patents Grantslast 30 patents

Information Patent Grant
Method and arrangement for background compensation in material anal...
- Patent number 4,979,823
- Issue date Dec 25, 1990
- JENOPTIK JENA G.m.b.H.
- Joachim Mohr
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable echelle spectrometer arrangement and method for its adju...
- Patent number 4,856,898
- Issue date Aug 15, 1989
- Jenoptik Jena G.m.b.H.
- Helmut Becker-Ross
- G01 - MEASURING TESTING