Feng-Jia Shiu

Person

Hsinchu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method for reducing charging of semiconductor wafers
- Patent number 12,165,867
- Issue date Dec 10, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Lin Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Implantation mask formation
- Patent number 12,100,592
- Issue date Sep 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Chao Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor imaging device having improved dark current performance
- Patent number 12,040,336
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Seiji Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Via structure and methods of forming the same
- Patent number 12,010,933
- Issue date Jun 11, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chieh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor device and manufacturing method thereof
- Patent number 11,996,432
- Issue date May 28, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chao Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing charging of semiconductor wafers
- Patent number 11,769,662
- Issue date Sep 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Lin Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Improving surface topography by forming spacer-like components
- Patent number 11,665,897
- Issue date May 30, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chun-Chang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Implantation mask formation
- Patent number 11,658,031
- Issue date May 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Chao Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor imaging device having improved dark current performance
- Patent number 11,538,837
- Issue date Dec 27, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Seiji Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of manufacturing semiconductor device and semiconductor device
- Patent number 11,502,044
- Issue date Nov 15, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ying-Hua Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
VIA structure and methods of forming the same
- Patent number 11,489,115
- Issue date Nov 1, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chieh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor device and manufacturing method thereof
- Patent number 11,411,033
- Issue date Aug 9, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chao Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface topography by forming spacer-like components
- Patent number 11,276,699
- Issue date Mar 15, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chun-Chang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using a surfactant-containing shrinkage material to preve...
- Patent number 11,086,221
- Issue date Aug 10, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chao Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of manufacturing semiconductor device and semiconductor device
- Patent number 11,056,440
- Issue date Jul 6, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ying-Hua Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and methods of manufacturing thereof
- Patent number 11,049,767
- Issue date Jun 29, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tsai-Ming Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor imaging device having improved dark current performance
- Patent number 11,004,880
- Issue date May 11, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Seiji Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
VIA structure and methods of forming the same
- Patent number 10,998,498
- Issue date May 4, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chieh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor device
- Patent number 10,943,783
- Issue date Mar 9, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Che Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 10,910,260
- Issue date Feb 2, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chieh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor imaging device having improved dark current performance
- Patent number 10,797,091
- Issue date Oct 6, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Seiji Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using a surfactant-containing shrinkage material to preve...
- Patent number 10,734,436
- Issue date Aug 4, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chao Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of high-aspect ratio pattern formation with submicron pixel...
- Patent number 10,546,889
- Issue date Jan 28, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chao Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface topography by forming spacer-like components
- Patent number 10,522,557
- Issue date Dec 31, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Chang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 10,510,587
- Issue date Dec 17, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chieh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
VIA structure and methods of forming the same
- Patent number 10,439,135
- Issue date Oct 8, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chieh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit structure with guard ring
- Patent number 10,366,916
- Issue date Jul 30, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chihy-Yuan Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Assistant pattern for measuring critical dimension of main pattern...
- Patent number 10,276,375
- Issue date Apr 30, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hung-Wen Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Patterning for substrate fabrication
- Patent number 10,186,542
- Issue date Jan 22, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chao Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of high-aspect ratio pattern formation with submicron pixel...
- Patent number 10,121,811
- Issue date Nov 6, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chao Chiu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240404877
- Publication date Dec 5, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsai-Ming HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPLANTATION MASK FORMATION
- Publication number 20240379357
- Publication date Nov 14, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY , LTD.
- Wei-Chao CHIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIA STRUCTURE AND METHODS OF FORMING THE SAME
- Publication number 20240334847
- Publication date Oct 3, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chieh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR IMAGING DEVICE HAVING IMPROVED DARK CURRENT PERFORMANCE
- Publication number 20240313010
- Publication date Sep 19, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Seiji Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
- Publication number 20240282582
- Publication date Aug 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Chao CHIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20240274637
- Publication date Aug 15, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chao CHIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DOUBLE PATTERNING TECHNIQUES FOR FORMING A DEEP TRENCH ISOLATION ST...
- Publication number 20230402315
- Publication date Dec 14, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Chao CHIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REDUCING CHARGING OF SEMICONDUCTOR WAFERS
- Publication number 20230386820
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Lin CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPLANTATION MASK FORMATION
- Publication number 20230290637
- Publication date Sep 14, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Chao CHIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR IMAGING DEVICE HAVING IMPROVED DARK CURRENT PERFORMANCE
- Publication number 20230109829
- Publication date Apr 13, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Seiji Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Via Structure And Methods Of Forming The Same
- Publication number 20230059026
- Publication date Feb 23, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Wei-Chieh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20220359588
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chao CHIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REDUCING CHARGING OF SEMICONDUCTOR WAFERS
- Publication number 20220301849
- Publication date Sep 22, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Lin CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPLANTATION MASK FORMATION
- Publication number 20220285155
- Publication date Sep 8, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Chao CHIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DOUBLE PATTERNING TECHNIQUES FOR FORMING A DEEP TRENCH ISOLATION ST...
- Publication number 20220285203
- Publication date Sep 8, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Chao CHIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Improving Surface Topography by Forming Spacer-Like Components
- Publication number 20220199636
- Publication date Jun 23, 2022
- Taiwan Semiconductor Manufacturing Co., LTD
- Chun-Chang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHODS OF MANUFACTURING THEREOF
- Publication number 20210327748
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsai-Ming HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
- Publication number 20210327820
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ying-Hua CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR IMAGING DEVICE HAVING IMPROVED DARK CURRENT PERFORMANCE
- Publication number 20210280620
- Publication date Sep 9, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Seiji Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIA Structure and Methods of Forming the Same
- Publication number 20210257548
- Publication date Aug 19, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chieh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20210193705
- Publication date Jun 24, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chao CHIU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR IMAGING DEVICE HAVING IMPROVED DARK CURRENT PERFORMANCE
- Publication number 20210005649
- Publication date Jan 7, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Seiji Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Using A Surfactant-Containing Shrinkage Material to Preve...
- Publication number 20200365645
- Publication date Nov 19, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chao Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
- Publication number 20200176390
- Publication date Jun 4, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ying-Hua CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHODS OF MANUFACTURING THEREOF
- Publication number 20200135538
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tsai-Ming HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface Topography by Forming Spacer-Like Components
- Publication number 20200127000
- Publication date Apr 23, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Chun-Chang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE
- Publication number 20200075318
- Publication date Mar 5, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Che CHUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20200058545
- Publication date Feb 20, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chieh HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIA Structure and Methods of Forming the Same
- Publication number 20200035918
- Publication date Jan 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chieh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR IMAGING DEVICE HAVING IMPROVED DARK CURRENT PERFORMANCE
- Publication number 20190371838
- Publication date Dec 5, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Seiji Takahashi
- H01 - BASIC ELECTRIC ELEMENTS

Feng-Jia Shiu

Person

Patents Grantslast 30 patents

Method for reducing charging of semiconductor wafers

Implantation mask formation

Semiconductor imaging device having improved dark current performance

Via structure and methods of forming the same

Image sensor device and manufacturing method thereof

Method for reducing charging of semiconductor wafers

Improving surface topography by forming spacer-like components

Implantation mask formation

Semiconductor imaging device having improved dark current performance

Methods of manufacturing semiconductor device and semiconductor device

VIA structure and methods of forming the same

Image sensor device and manufacturing method thereof

Surface topography by forming spacer-like components

Method of using a surfactant-containing shrinkage material to preve...

Methods of manufacturing semiconductor device and semiconductor device

Semiconductor device and methods of manufacturing thereof

Semiconductor imaging device having improved dark current performance

VIA structure and methods of forming the same

Method for manufacturing a semiconductor device

Method for manufacturing semiconductor device

Semiconductor imaging device having improved dark current performance

Method of using a surfactant-containing shrinkage material to preve...

Method of high-aspect ratio pattern formation with submicron pixel...

Surface topography by forming spacer-like components

Method for manufacturing semiconductor device

VIA structure and methods of forming the same

Integrated circuit structure with guard ring

Assistant pattern for measuring critical dimension of main pattern...

Patterning for substrate fabrication

Method of high-aspect ratio pattern formation with submicron pixel...

Patents Applicationslast 30 patents

METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE

IMPLANTATION MASK FORMATION

VIA STRUCTURE AND METHODS OF FORMING THE SAME

SEMICONDUCTOR IMAGING DEVICE HAVING IMPROVED DARK CURRENT PERFORMANCE

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE

IMAGE SENSOR DEVICE AND MANUFACTURING METHOD THEREOF

DOUBLE PATTERNING TECHNIQUES FOR FORMING A DEEP TRENCH ISOLATION ST...

METHOD FOR REDUCING CHARGING OF SEMICONDUCTOR WAFERS

IMPLANTATION MASK FORMATION

SEMICONDUCTOR IMAGING DEVICE HAVING IMPROVED DARK CURRENT PERFORMANCE

Via Structure And Methods Of Forming The Same

IMAGE SENSOR DEVICE AND MANUFACTURING METHOD THEREOF

METHOD FOR REDUCING CHARGING OF SEMICONDUCTOR WAFERS

IMPLANTATION MASK FORMATION

DOUBLE PATTERNING TECHNIQUES FOR FORMING A DEEP TRENCH ISOLATION ST...

Improving Surface Topography by Forming Spacer-Like Components

SEMICONDUCTOR DEVICE AND METHODS OF MANUFACTURING THEREOF

METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE

SEMICONDUCTOR IMAGING DEVICE HAVING IMPROVED DARK CURRENT PERFORMANCE

VIA Structure and Methods of Forming the Same

IMAGE SENSOR DEVICE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR IMAGING DEVICE HAVING IMPROVED DARK CURRENT PERFORMANCE

Method of Using A Surfactant-Containing Shrinkage Material to Preve...

METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHODS OF MANUFACTURING THEREOF

Surface Topography by Forming Spacer-Like Components

METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

VIA Structure and Methods of Forming the Same

SEMICONDUCTOR IMAGING DEVICE HAVING IMPROVED DARK CURRENT PERFORMANCE