Feng Lu

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,869,602
- Issue date Oct 28, 2014
- Anasys Instruments Corp.
- Mikhail Belkin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High Frequency Deflection Measurement of IR Absorption
- Publication number 20120167261
- Publication date Jun 28, 2012
- Mikhail Belkin
- G01 - MEASURING TESTING