Feng-Ming Kuo

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Tao-Yuan Hsien, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method of building a defect database
- Patent number 7,020,536
- Issue date Mar 28, 2006
- Powerchip Semiconductor Corp.
- Long-Hui Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF BUILDING A DEFECT DATABASE
- Publication number 20050177264
- Publication date Aug 11, 2005
- Long-Hui Lin
- G01 - MEASURING TESTING