Feng Pan

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Clifton Park, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for flat panel detector gel and blot imaging
- Patent number 9,891,192
- Issue date Feb 13, 2018
- General Electric Company
- Feng Pan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for flat panel detector gel and blot imaging
- Patent number 9,594,053
- Issue date Mar 14, 2017
- General Electric Company
- Feng Pan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for flat panel detector gel and blot imaging
- Patent number 9,383,336
- Issue date Jul 5, 2016
- General Electric Company
- Feng Pan
- G01 - MEASURING TESTING
Information Patent Grant
Chiral polymer compositions exhibiting nonlinear optical properties
- Patent number 6,288,206
- Issue date Sep 11, 2001
- Molecular OptoElectronics Corporation
- Kevin R. Stewart
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Organic crystal compound optical waveguide and methods for its fabr...
- Patent number 5,982,961
- Issue date Nov 9, 1999
- Molecular OptoElectronics Corporation
- Feng Pan
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR FLAT PANEL DETECTOR GEL AND BLOT IMAGING
- Publication number 20150285761
- Publication date Oct 8, 2015
- GENERAL ELECTRIC COMPANY
- Feng Pan
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR FLAT PANEL DETECTOR GEL AND BLOT IMAGING
- Publication number 20150285763
- Publication date Oct 8, 2015
- GENERAL ELECTRIC COMPANY
- Feng Pan
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR FLAT PANEL DETECTOR GEL AND BLOT IMAGING
- Publication number 20150285762
- Publication date Oct 8, 2015
- GENERAL ELECTRIC COMPANY
- Feng Pan
- G01 - MEASURING TESTING
Information Patent Application
TARGET-LINKED RADIATION IMAGING SYSTEM
- Publication number 20120008828
- Publication date Jan 12, 2012
- Brian David Yanoff
- G01 - MEASURING TESTING