Feng Zhao

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Arcadia, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Compact and low cost beam launcher using planar lightwave circuit
- Patent number 10,718,915
- Issue date Jul 21, 2020
- California Institute of Technology
- Feng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Swept frequency laser metrology system
- Patent number 7,764,384
- Issue date Jul 27, 2010
- The United States of America as represented by the administrator of the Natio...
- Feng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric apparatus for ultra-high precision displacement mea...
- Patent number 6,710,880
- Issue date Mar 23, 2004
- The United States of America as represented by the administrator of the Natio...
- Feng Zhao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPACT AND LOW COST BEAM LAUNCHER USING PLANAR LIGHTWAVE CIRCUIT
- Publication number 20180364431
- Publication date Dec 20, 2018
- California Institute of Technology
- Feng Zhao
- G01 - MEASURING TESTING