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Shanghai, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Optical structure
Patent number
10,754,166
Issue date
Aug 25, 2020
Mettler-Toledo Instruments (Shanghai) Co. Ltd
Changlin Wang
G02 - OPTICS
Information
Patent Grant
Method and device for detecting failures in inductive conductivity...
Patent number
8,508,234
Issue date
Aug 13, 2013
Mettler-Toledo AG
Changlin Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for inductive conductivity measurements of a flui...
Patent number
8,456,178
Issue date
Jun 4, 2013
Mettler-Toledo AG
Changlin Wang
G01 - MEASURING TESTING
Information
Patent Grant
Input circuit for inductive measurements of the conductivity of a f...
Patent number
8,451,007
Issue date
May 28, 2013
Mettler-Toledo AG
Fengjin Wang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL STRUCTURE
Publication number
20190355870
Publication date
Nov 21, 2019
Mettler-Toledo Instruments (Shanghai) Co. Ltd
Changlin Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND DEVICE FOR DETECTING FAILURES IN INDUCTIVE CONDUCTIVITY...
Publication number
20110163756
Publication date
Jul 7, 2011
METTLER-TOLEDO AG
Changlin Wang
G01 - MEASURING TESTING
Information
Patent Application
INPUT CIRCUIT FOR INDUCTIVE MEASUREMENTS OF THE CONDUCTIVITY OF A F...
Publication number
20110140716
Publication date
Jun 16, 2011
METTLER-TOLEDO AG
Fengjin Wang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR INDUCTIVE CONDUCTIVITY MEASUREMENTS OF A FLUI...
Publication number
20110140717
Publication date
Jun 16, 2011
METTLER-TOLEDO AG
Changlin Wang
G01 - MEASURING TESTING