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Fengyuan Li
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Chandler, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Z-axis inertial sensor with extended motion stops
Patent number
11,499,987
Issue date
Nov 15, 2022
NXP USA, INC.
Andrew C McNeil
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS device with off-axis shock protection
Patent number
10,247,753
Issue date
Apr 2, 2019
NXP USA, INC.
Aaron A. Geisberger
G01 - MEASURING TESTING
Information
Patent Grant
Differential capacitive output pressure sensor and method
Patent number
9,829,406
Issue date
Nov 28, 2017
NXP USA, INC.
Aaron A Geisberger
G01 - MEASURING TESTING
Information
Patent Grant
Devices and methods for testing integrated circuit devices
Patent number
9,818,656
Issue date
Nov 14, 2017
NXP USA, INC.
Mark Edward Schlarmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MEMS sensor with side port and method of fabricating same
Patent number
9,790,089
Issue date
Oct 17, 2017
NXP USA, INC.
Chad S. Dawson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method of making a MEMS die having a MEMS device on a suspended str...
Patent number
9,458,008
Issue date
Oct 4, 2016
FREESCALE SEMICONDUCTOR, INC.
Chad S. Dawson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
INERTIAL SENSOR WITH SPLIT ANCHORS AND FLEXURE COMPLIANCE BETWEEN T...
Publication number
20220050124
Publication date
Feb 17, 2022
NXP USA, Inc.
Fengyuan Li
G01 - MEASURING TESTING
Information
Patent Application
Z-AXIS INERTIAL SENSOR WITH EXTENDED MOTION STOPS
Publication number
20210396781
Publication date
Dec 23, 2021
NXP USA, Inc.
Andrew C. McNeil
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS DEVICE WITH OFF-AXIS SHOCK PROTECTION
Publication number
20180231579
Publication date
Aug 16, 2018
NXP USA, Inc.
Aaron A. Geisberger
G01 - MEASURING TESTING
Information
Patent Application
MEMS SENSOR WITH SIDE PORT AND METHOD OF FABRICATING SAME
Publication number
20170174509
Publication date
Jun 22, 2017
NXP USA, Inc.
Chad S. Dawson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS SENSOR DEVICE HAVING INTEGRATED MULTIPLE STIMULUS SENSING
Publication number
20170115322
Publication date
Apr 27, 2017
FREESCALE SEMICONDUCTOR, INC.
FENGYUAN LI
G01 - MEASURING TESTING
Information
Patent Application
MEMS SENSOR WITH SIDE PORT AND METHOD OF FABRICATING SAME
Publication number
20170081179
Publication date
Mar 23, 2017
FREESCALE SEMICONDUCTOR, INC.
CHAD S. DAWSON
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DIFFERENTIAL CAPACITIVE OUTPUT PRESSURE SENSOR AND METHOD
Publication number
20170074738
Publication date
Mar 16, 2017
FREESCALE SEMICONDUCTOR, INC.
Aaron A. GEISBERGER
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD FOR SUSPENDED MEMS DEVICE
Publication number
20160272482
Publication date
Sep 22, 2016
FREESCALE SEMICONDUCTOR, INC.
CHAD S. DAWSON
B81 - MICRO-STRUCTURAL TECHNOLOGY