Ferris Liu

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Pingtung City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Highly sensitive defect detection method
- Patent number 7,362,428
- Issue date Apr 22, 2008
- ProMos Technologies Inc.
- Chung-I Chang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Highly sensitive defect detection method
- Publication number 20060187446
- Publication date Aug 24, 2006
- Chung-I Chang
- G01 - MEASURING TESTING