Filip Lopour

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Brno, CZ

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus with two or more particle beams for processing a specimen
- Patent number 10,629,412
- Issue date Apr 21, 2020
- Tescan Orsay Holding, A.S.
- Filip Lopour
- G01 - MEASURING TESTING
Information Patent Grant
Device with ion column and scanning electron microscope
- Patent number 10,535,496
- Issue date Jan 14, 2020
- TESCAN Brno, s.r.o.
- Jaroslav Jiruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and method of use thereof
- Patent number 10,504,694
- Issue date Dec 10, 2019
- TESCAN Brno, s.r.o.
- Jaroslav Jiruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of specimen processing in an apparatus with two or more part...
- Patent number 10,109,457
- Issue date Oct 23, 2018
- Tescan Orsay Holding, A.S.
- Filip Lopour
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron detector including an intimately-coupled scintillator-phot...
- Patent number 8,729,471
- Issue date May 20, 2014
- Pulsetor, LLC
- Nicholas C. Barbi
- G01 - MEASURING TESTING
Information Patent Grant
Secondary electron detector, especially in a scanning electron micr...
- Patent number 7,193,222
- Issue date Mar 20, 2007
- Tescan s.r.o.
- Marcus Jacka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Unknown
- Publication number 20190088445
- Publication date Mar 21, 2019
- TESCAN Brno, s.r.o.
- Jaroslav Jiruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus with Two or More Particle Beams for Processing a Specimen
- Publication number 20180012729
- Publication date Jan 11, 2018
- TESCAN ORSAY HOLDING, a.s.
- Filip LOPOUR
- G01 - MEASURING TESTING
Information Patent Application
Scanning Electron Microscope and Method of Use Thereof
- Publication number 20170338078
- Publication date Nov 23, 2017
- TESCAN Brno, s.r.o.
- Jaroslav Jiruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF SPECIMEN PROCESSING IN AN APPARATUS WITH TWO OR MORE PART...
- Publication number 20160148783
- Publication date May 26, 2016
- TESCAN ORSAY HOLDING, a.s.
- Filip LOPOUR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DETECTOR INCLUDING AN INTIMATELY-COUPLED SCINTILLATOR-PHO...
- Publication number 20120025074
- Publication date Feb 2, 2012
- PulseTor, LLC.
- Nicholas C. Barbi
- G01 - MEASURING TESTING