Finteis Thomas

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Munich, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for testing a device for storing data
- Patent number 7,159,157
- Issue date Jan 2, 2007
- Infineon Technologies AG
- Thomas Finteis
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing memory units to be tested and test device
- Patent number 7,020,806
- Issue date Mar 28, 2006
- Infineon Technologies AG
- Thomas Finteis
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory chip and apparatus for testing a memory chip
- Patent number 6,961,882
- Issue date Nov 1, 2005
- Infineon Technologies AG
- Dobler Manfred
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing circuit units to be tested with increased data c...
- Patent number 6,898,747
- Issue date May 24, 2005
- Infineon Technologies AG
- Thomas Finteis
- G01 - MEASURING TESTING