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Firas Abughazaleh
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Temperature sensor
Patent number
11,927,493
Issue date
Mar 12, 2024
NXP B.V.
Saurabh Goyal
G01 - MEASURING TESTING
Information
Patent Grant
Fractional N PLL with sigma-delta noise cancellation
Patent number
10,998,911
Issue date
May 4, 2021
NXP USA, INC.
Firas N. Abughazaleh
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Phase to digital converter
Patent number
10,819,355
Issue date
Oct 27, 2020
NXP USA, INC.
Firas N. Abughazaleh
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Temperature sensor circuitry and method therefor
Patent number
10,386,243
Issue date
Aug 20, 2019
NXP USA, INC.
Firas N. Abughazaleh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Thermal monitoring system in an integrated circuit die
Patent number
10,352,782
Issue date
Jul 16, 2019
NXP USA, INC.
Tommi Jorma Mikael Jokinen
G01 - MEASURING TESTING
Information
Patent Grant
Operation amplifiers with offset cancellation
Patent number
9,941,852
Issue date
Apr 10, 2018
NXP USA, INC.
Firas N. Abughazaleh
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Bounded duty cycle correction circuit
Patent number
9,641,165
Issue date
May 2, 2017
NXP USA, INC.
Venkataram Mooraka
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Programmable charge pump
Patent number
9,634,561
Issue date
Apr 25, 2017
FREESCALE SEMICONDUCTOR, INC.
Anand Kumar Sinha
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Phase-locked loop with frequency bounding circuit
Patent number
9,490,824
Issue date
Nov 8, 2016
FREESCALE SEMICONDUCTOR, INC.
Devesh P. Singh
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for reducing parasitic capacitance
Patent number
7,888,202
Issue date
Feb 15, 2011
Xilinx, Inc.
Firas N. Abughazaleh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for reducing parasitic capacitance
Patent number
7,619,298
Issue date
Nov 17, 2009
Xilinx, Inc.
Firas N. Abughazaleh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Substrate coupled noise isolation for integrated circuits
Patent number
7,541,652
Issue date
Jun 2, 2009
Xilinx, Inc.
Firas N. Abughazaleh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Clock and data recovery circuit having operating parameter compensa...
Patent number
7,512,848
Issue date
Mar 31, 2009
Xilinx, Inc.
Firas N. Abughazaleh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
NRZ/PAM-4/PRML triple mode phase and data detector
Patent number
7,505,541
Issue date
Mar 17, 2009
Xilinx, Inc.
Brian T. Brunn
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for data density-independent phase adjustment...
Patent number
7,184,511
Issue date
Feb 27, 2007
Xilinx, Inc.
Ahmed Younis
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Integrated high-speed serial-to-parallel and parallel-to-serial tra...
Patent number
7,058,120
Issue date
Jun 6, 2006
Xilinx, Inc.
Jinghui Lu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Differential cascode amplifier
Patent number
6,642,788
Issue date
Nov 4, 2003
Xilinx, Inc.
Firas N. Abughazaleh
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for synchronizing signals
Patent number
6,184,813
Issue date
Feb 6, 2001
Legerity, Inc.
Firas N. Abughazaleh
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Arrangement and method for controlling gain of analog-to-digital co...
Patent number
5,963,159
Issue date
Oct 5, 1999
Advanced Micro Devices
Firas N. Abughazaleh
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
TEMPERATURE SENSOR
Publication number
20230184594
Publication date
Jun 15, 2023
NXP B.V.
Saurabh Goyal
G01 - MEASURING TESTING
Information
Patent Application
THERMAL MONITORING SYSTEM IN AN INTEGRATED CIRCUIT DIE
Publication number
20180252597
Publication date
Sep 6, 2018
NXP USA, Inc.
TOMMI JORMA MIKAEL JOKINEN
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSOR CIRCUITRY AND METHOD THEREFOR
Publication number
20180149526
Publication date
May 31, 2018
NXP USA, Inc.
FIRAS N. ABUGHAZALEH
G01 - MEASURING TESTING
Information
Patent Application
OPERATION AMPLIFIERS WITH OFFSET CANCELLATION
Publication number
20180091105
Publication date
Mar 29, 2018
FREESCALE SEMICONDUCTOR, INC.
FIRAS N. ABUGHAZALEH
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Method and apparatus for data density-independent phase adjustment...
Publication number
20050134339
Publication date
Jun 23, 2005
Xilinx, Inc.
Ahmed Younis
H04 - ELECTRIC COMMUNICATION TECHNIQUE