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Félix Rochette
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Quebec, CA
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Patents Grants
last 30 patents
Information
Patent Grant
Structured light matching of a set of curves from three cameras
Patent number
10,643,343
Issue date
May 5, 2020
Creaform Inc.
Félix Rochette
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
3-D scanning and positioning system
Patent number
9,816,809
Issue date
Nov 14, 2017
CREAFORM INC.
Patrick Hebert
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Sensor positioning for 3D scanning
Patent number
9,325,974
Issue date
Apr 26, 2016
CREAFORM INC.
Patrick Hébert
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and system for alignment of a pattern on a spatial coded sli...
Patent number
8,836,766
Issue date
Sep 16, 2014
Creaform Inc.
Patrick Hebert
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR AUTOMATIC EXPOSURE CONTROL OF A 3D SCANNING SYSTEM AND 3...
Publication number
20250088753
Publication date
Mar 13, 2025
CREAFORM INC.
Jean-Nicolas Ouellet
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
3D SCANNER WITH STRUCTURED LIGHT PATTERN PROJECTOR AND METHOD OF US...
Publication number
20240288267
Publication date
Aug 29, 2024
CREAFORM INC.
Jean-Nicolas Ouellet
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
STRUCTURED LIGHT MATCHING OF A SET OF CURVES FROM TWO CAMERAS
Publication number
20190236798
Publication date
Aug 1, 2019
CREAFORM INC.
Félix Rochette
G01 - MEASURING TESTING
Information
Patent Application
3-D SCANNING AND POSITIONING SYSTEM
Publication number
20150138349
Publication date
May 21, 2015
CREAFORM INC.
Patrick Hébert
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR ALIGNMENT OF A PATTERN ON A SPATIAL CODED SLI...
Publication number
20140247326
Publication date
Sep 4, 2014
CREAFORM INC.
Patrick Hébert
G01 - MEASURING TESTING
Information
Patent Application
SENSOR POSITIONING FOR 3D SCANNING
Publication number
20140085429
Publication date
Mar 27, 2014
Patrick Hébert
G01 - MEASURING TESTING