Floor Lodewijk KEUKENS

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Turnhout, BE

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Patents Grantslast 30 patents

Information Patent Grant
Inspection substrate and an inspection method
- Patent number 10,725,390
- Issue date Jul 28, 2020
- ASML Netherlands B.V.
- Seerwan Saeed
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection substrate and an inspection method
- Patent number 10,216,100
- Issue date Feb 26, 2019
- ASML Netherlands B.V.
- Seerwan Saeed
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FLUID HANDLING STRUCTURE FOR LITHOGRAPHIC APPARATUS
- Publication number 20200409270
- Publication date Dec 31, 2020
- ASML NETHERLANDS B.V.
- Pepijn VAN DEN EIJNDEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Substrate and an Inspection Method
- Publication number 20190146352
- Publication date May 16, 2019
- ASML NETHERLANDS B.V.
- Seerwan Saeed
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Substrate and an Inspection Method
- Publication number 20180181004
- Publication date Jun 28, 2018
- ASML NETHERLANDS B.V.
- Seerwan SAEED
- H01 - BASIC ELECTRIC ELEMENTS